Accuracy in the Determination of Thin Films Optical Constants by the Atr Method
نویسنده
چکیده
In this paper we present evidence that important systematic errors, owing to the light beam imperfections, account for the anomalous decrease of the calculated values of the film thickness as a function of the wavelength in the near infrared. In the Kretschmann and Raether configuration /1//2/ (prism/thin metal film/vacuum), a Surface Plasma Wave (SPW) can be excited at the metal/vacuum interface, by matching the incoming wavevector component parallel to the surface Kx and the wavevector Kq of the SPW : P
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